Xide LI Professor
The research areas of Professor Li’s group are Micro/Nano Mechanics, Experimental Mechanics, and Mechanics of Aerospace and Engineering Safety, with special focus on:
Investigating the mechanical behaviors of micro/nano objects owing to their dimension reducing, environmental atmosphere effect and interactions, developing new measurement techniques and instruments to measure the mechanical properties of micro/nano objects/ components or films.
Advanced experimental methods and technologies in optical techniques, such as Speckle interferometry, Holography interferometry, Digital holography, Moiré interferometry, Phase shifting, Carried wave, Marker and grating methods, Digital speckle/image correlation, interfermetric and synchrony radiation computerized tomography.
New methods and instruments to defect detection and structure evaluation, 3-D reconstruction and measurement of the engineering structures and devices with the optical and the synchronic radiation beams, nondestructive test techniques and analysis methods, particular in large-scale structures and harsh environment.
Material property characterization and thermal-mechanical reliability assessment of interconnect structure, microelectronic packaging and micro/nano-electrical-mechanical systems (MEMS/NEMS).
Nanomechanics, Mechanical properties of structures, devices and films at macro, micro and nano scales, Surface/interfacial interactions, Macro/micro/nano experimental mechanics, Mechanics of Aerospace and Engineering structures Safety and Integrity, Laser and optical Metrology, NDT and NDE of materials and structures, Testing Instruments, Devices and sensors.
Recent Publications, Presentations and Events
Guest Editor of the Special issue
 Li Xide, Wu, XP, Kang, Yilan (2005): Microoptical metrology in China. Opt. Lasers Eng. 43, 833-835. [PDF]
(1) Micro/Nanomechanics, micro/nanodevices, micro/nano sensors
 Li Xide, Su Dongchuan, Zhang Zhao (2009): A novel technique of microforce sensing and loading, Sensor Actuat A-physt. 153, 13-23. [ PDF ]
 Zeng DJ, Wei XL, Liu JZ, Chen Q, Li Xide, Zheng QS (2009): Tunable resonant frequencies for determining Young's moduli of nanowires. J Appl Phys, 105, 114311. [PDF]
 Li Xide, Yang Yan (2006): An optical probe stage and its applications in mechanical behavior measurements of micro-objects and thin films, J Micromech Microeng, 16, 1897-1907. [PDF]
 Li Xide, Peng Yun (2006): Investigation of capillary adhesion between the microcantilever and the substrate with electronic speckle pattern interferometry, Appl Phy Lett, 89, 234104. [PDF]
(2) Mechanical behaviors of Materials and Structures
 Wu W, Li Xide, Liu L (2009): A uniaxial tension system and its applications in testing of thin films and small components. Rev Sci Instrum. 80, 085107. [ PDF ]
 Li Xide, Yang Yan, Wei Cheng (2005): Experimental investigation of polycrystalline material deformation based on a grain scale, Chin. Phys. Lett. 22, 2553-2556. [PDF]
 Tao Gang, Li Xide, Shi Hui-Ji (2004): Study of Ballistite material Mechanical Behaviors Using Temporal Speckle Pattern Interferometry, Mechanics of Materials, 36, 275-283. [PDF]
(3) Speckle Interferometry and Temporal speckle pattern Interferometry
 Li Xide, Yang Yan, Wei Cheng (2004): In-situ and real-time tensile testing of thin films using double-field-of-view electronic speckle pattern interferometry, Meas Sci Technol, 15, 75-83. [PDF]
 Li Xide, Soh AK, Deng Bing, Guo Xianghua (2002): High-precision large deflection measurements of thin films using time sequence speckle pattern interferometry, Measurement Science and Technology, 13, 1304-1310. [PDF]
 Li Xide, Tao Gang, Yang Yizhang (2001): Continual deformation analysis with scanning phase method and time sequence phase method in temporal speckle pattern interferometry, Optics & Laser technology, 33, 53-59. [PDF]
(4) Nondestructive Testing/Evaluation
 Li Xide, Liu Xingfu, Wang Kai (2002): Quantitative detection of the defects in thin-walled pressure vessels with holography and shearing speckle interferometry, Journal of Nondestructive Evaluation, 21, 85-94. [PDF]
 Li Xide, Soh A K, Huang C, Shi HJ (2002): Detection of small cracks and cavities using laser diffraction, Optical Engineering, 41, 1295-1308. [PDF]
 Li Xide (2000): Wavelet transform for detection of partial fringe patterns induced by defects in nondestructive testing of holographic interferometry and electronic speckle pattern interferometry, Optical Engineering, 39, 2821-2827. [PDF]
(5) Optical computerized Tomography
 Li Xide, Gren P, Wahlin A, Schedin S (1999): Pulsed TV holography and tomography for the study of transient waves in air, Optics & Laser Technology, 31, 23-32. [PDF]
 Gren P, Schedin S, Li Xide (1998): Tomographic reconstruction of transient acoustic fields recorded by pulsed TV holography, Applied Optics, 38, 834-840. [PDF]
Tel: 86-10-6279 4410 Back
Web link: http://mech.tsinghua.edu.cn